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Kokusai Electric Semiconductor Service Inc.

Resistivity Measurement System (manual type) VR300DE

VR300DE

Outline

VR300DE is a manual type four-probe measurement System.
Thanks to our probe movement control systems, which is one of our core technologies, the System can measure a resistance and a sheet resistance of conductive samples such as silicon wafers, magnetic thin plates, etc. with a high degree of accuracy.

Characteristics

  • Wafer size: 75mm (three inches) ‐ 300mm
  • Probe movement control mechanisms measure very thin films and very shallow ion implantation layers keeping high accuracy.
  • Optimum prove movement can be set up with recipes.
  • It is possible to make images such as contour maps or 3D maps to show resistance distribution.
  • A function for host communication is available.

Application

  • Materials such as silicon, polysilicon, etc.
  • Ion implantation, diffusion, metal films, etc.

Contact for the Resistivity Measurement System:

(Phone and Fax)
Kokusai Electric Semiconductor Service Inc.
Sales Department, Applied Electronics Division
Phone:+81-3-5297-8529 Fax:+81-3-3256-3073