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Kokusai Electric Semiconductor Service Inc.

VR250

Resistivity Measurement System (manual type) VR250

VR250

Outline

VR250 is a manual four-point probe measuring instrument that achieves high-precision measurement of the resistivity and sheet resistance of conductive samples such as silicon wafers and thin magnetic plates.

Features

  • Wafer size: 75mm (three inches) ‐ 200mm
  • Very thin films and very shallow ion implantation layers can be measured keeping high accuracy.
  • Optimum prove movement can be set up with recipes.
  • It is possible to make images such as contour maps or 3D maps to show resistance distribution (optional).
  • A function for host communication is available.

Application

  • Materials such as silicon, polysilicon, etc.
  • Ion implantation, diffusion, metal films, etc.

Contact for the Resistivity Measurement System:

(Phone and Fax)
Kokusai Electric Semiconductor Service Inc.
Sales Department, Applied Electronics Division
Phone:+81-42-512-7282 Fax:+81-42-512-7907